Semiconductor Fabrication and Characterisation at NCU

The state-of-the-art characterisation facilities at NCU provide advanced tools for material and device analysis. Equipped with cutting-edge instruments such as Scanning Electron Microscope (SEM), X-Ray Diff raction (XRD), UV Vis Spectrophotometer, and more, these labs support high-quality research in semiconductors. These facilities are actively used by students and faculty for in-depth experimental investigations and innovation-driven projects.